1-mS constant-Gm GaN transconductor with embedded process compensation

Katia Samperi, S. Pennisi, F. Pulvirenti, G. Palmisano
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引用次数: 3

Abstract

This paper presents the design of a GaN constant-Gm transconductor for smart-power applications. The proposed solution exploits source degeneration to linearize the transconductance and three cascode current mirrors to increase the transconductance and provide differential to single-ended conversion. Moreover, a biasing section is added to cope with the wide process spread, especially in threshold voltages, of both enhancement and depletion GaN transistors. Nominal simulation results show that the proposed transconductor, supplied from 6-V and biased with 655 μ A provides 1 mS transconductance, within a linear differential input range of ±100 mV up to more than 10 MHz.
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内置工艺补偿的1ms恒gm GaN晶体管
本文介绍了一种用于智能电源应用的氮化镓恒变gm晶体管的设计。所提出的解决方案利用源退化来线性化跨导和三个级联码电流镜来增加跨导并为单端转换提供差分。此外,偏置部分的增加,以应付宽的过程扩散,特别是在阈值电压,增强和耗尽氮化镓晶体管。标称仿真结果表明,在±100 mV到大于10 MHz的线性差分输入范围内,采用655 μ A偏置、6v供电的该晶体管可提供1 mS的跨导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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