A. Merfeldas, D. Andriukaitis, D. Gailius, A. Valinevicius, V. Markevičius, D. Navikas, M. Zilys
{"title":"Field Uniformity and TEM Mode Verification in GTEM 1000 Cell","authors":"A. Merfeldas, D. Andriukaitis, D. Gailius, A. Valinevicius, V. Markevičius, D. Navikas, M. Zilys","doi":"10.1109/ELEKTRO49696.2020.9130123","DOIUrl":null,"url":null,"abstract":"This paper investigates GTEM cell field uniformity and provides TEM mode verification for GTEM 1000 cell in the frequency range from 30 MHz to 1000 MHz. Field uniformity is essential in electromagnetic compatibility immunity tests. Uneven field distribution might lead to test mistakes and decrease measurement accuracy. Verification of TEM mode and field uniformity provides good representation of cell manufacturing quality, materials and structure imperfections or defects. GTEM cell capabilities for device under test size limits could be expanded knowing exact field distribution and uniformity at the reference plane.","PeriodicalId":165069,"journal":{"name":"2020 ELEKTRO","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 ELEKTRO","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELEKTRO49696.2020.9130123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper investigates GTEM cell field uniformity and provides TEM mode verification for GTEM 1000 cell in the frequency range from 30 MHz to 1000 MHz. Field uniformity is essential in electromagnetic compatibility immunity tests. Uneven field distribution might lead to test mistakes and decrease measurement accuracy. Verification of TEM mode and field uniformity provides good representation of cell manufacturing quality, materials and structure imperfections or defects. GTEM cell capabilities for device under test size limits could be expanded knowing exact field distribution and uniformity at the reference plane.
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