{"title":"Safety Evaluation of NanoFabrics","authors":"M. Grosso, M. Rebaudengo, M. Reorda","doi":"10.1109/DFT.2007.50","DOIUrl":null,"url":null,"abstract":"Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.","PeriodicalId":259700,"journal":{"name":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2007.50","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Chemically assembled electronic nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.
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