K. Yamamoto, M. Muramatsu, K. Yamamura, M. Ohmura, H. Utsuyama, H. Anzai, Y. Hayama
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引用次数: 0
Abstract
Evaluation devices of a double-sided silicon strip detector have been fabricated. These devices are basically AC-coupled and mainly designed to study the stability and reliability of a coupling capacitor to maintain low noise, high breakdown voltage. A hot electron analyzer was used to check the relation between breakdown voltage and charge injection in the coupling capacitor.<>
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