{"title":"Usage of ESD detector circuit for analyzing soft failures in IC cores","authors":"T. Ostermann","doi":"10.1109/SAPIW.2018.8401668","DOIUrl":null,"url":null,"abstract":"Due to ESD events on powered ICs, soft failures can occur in the IO pad frame and in the core of the IC. A detector cell can be used to detect these faults and distinguish between valid signal changes and soft failures. A corresponding digital detector cell with adjusted switching thresholds is presented in this paper. Since the detector cell is correspondingly small (150μm × 16.5μm), it can be placed several times in the IC and read out via a scan chain.","PeriodicalId":423850,"journal":{"name":"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAPIW.2018.8401668","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Due to ESD events on powered ICs, soft failures can occur in the IO pad frame and in the core of the IC. A detector cell can be used to detect these faults and distinguish between valid signal changes and soft failures. A corresponding digital detector cell with adjusted switching thresholds is presented in this paper. Since the detector cell is correspondingly small (150μm × 16.5μm), it can be placed several times in the IC and read out via a scan chain.
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