{"title":"NBTI mitigation by M-IVC with input duty cycle and randomness constraints","authors":"Maoxiang Yi, Xiaohong Liu, Qingwu Wu, Tianming Ni, Zhengfeng Huang, Huaguo Liang","doi":"10.1109/EWDTS.2016.7807666","DOIUrl":null,"url":null,"abstract":"An improved M-IVC scheme is proposed to mitigate the NBTI aging of circuit in standby mode, in which the input control vectors are randomly generated under constraint of the input duty cycles obtained by genetic algorithm. The experimental results show that compared with the existing M-IVC method, the circuit time delay degradation can be improved by 51.5% on average when S/A is 5/5 and the effectiveness gets better as S/A increases.","PeriodicalId":364686,"journal":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","volume":"144 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE East-West Design & Test Symposium (EWDTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2016.7807666","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
An improved M-IVC scheme is proposed to mitigate the NBTI aging of circuit in standby mode, in which the input control vectors are randomly generated under constraint of the input duty cycles obtained by genetic algorithm. The experimental results show that compared with the existing M-IVC method, the circuit time delay degradation can be improved by 51.5% on average when S/A is 5/5 and the effectiveness gets better as S/A increases.
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