Wisam Aljubouri, Ahish Mysore Somashekar, T. Haniotakis, S. Tragoudas
{"title":"Diagnosis of segment delay defects with current sensing","authors":"Wisam Aljubouri, Ahish Mysore Somashekar, T. Haniotakis, S. Tragoudas","doi":"10.1109/DFT.2014.6962101","DOIUrl":null,"url":null,"abstract":"A novel technique based on the current profile of path segments is presented. Certain current profiles can provide significant insights into the delay characteristics of the segments. They can assist in post-silicon diagnosis for delay defects and also determine shifts in the values of process parameters along the segments. A method to excite such current profiles is presented. Experimental evaluation on benchmark circuits shows the effectiveness of the approach.","PeriodicalId":414665,"journal":{"name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2014.6962101","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A novel technique based on the current profile of path segments is presented. Certain current profiles can provide significant insights into the delay characteristics of the segments. They can assist in post-silicon diagnosis for delay defects and also determine shifts in the values of process parameters along the segments. A method to excite such current profiles is presented. Experimental evaluation on benchmark circuits shows the effectiveness of the approach.
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