J. Bae, K. Hwang, K. H. Park, S. Jeon, J. Choi, J. Ahn, S. Kim, D. Ahn, H. Jeong, S. Nam, G. Jeong, H. Cho, D. Jang, Cg Park
{"title":"Investigation on physical origins of endurance failures in PRAM","authors":"J. Bae, K. Hwang, K. H. Park, S. Jeon, J. Choi, J. Ahn, S. Kim, D. Ahn, H. Jeong, S. Nam, G. Jeong, H. Cho, D. Jang, Cg Park","doi":"10.1109/IRPS.2012.6241900","DOIUrl":null,"url":null,"abstract":"Endurance failures are classified into three groups, all of which originate from the atomic transport of GST due to electromigration in molten phase. Based on the analysis, cell structure insusceptible to the atomic transport and for better cycling performance was proposed.","PeriodicalId":341663,"journal":{"name":"2012 IEEE International Reliability Physics Symposium (IRPS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2012.6241900","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Endurance failures are classified into three groups, all of which originate from the atomic transport of GST due to electromigration in molten phase. Based on the analysis, cell structure insusceptible to the atomic transport and for better cycling performance was proposed.
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