{"title":"Fabric defect classification using wavelet frames and minimum classification error training","authors":"Xuezhi Yang, G. Pang, N. Yung","doi":"10.1109/IAS.2002.1044102","DOIUrl":null,"url":null,"abstract":"This paper proposes a new method for fabric defect classification by incorporating the design of a wavelet frames based feature extractor with the design of a Euclidean distance based classifier. Channel variances at the outputs of the wavelet frame decomposition are used to characterize each nonoverlapping window of the fabric image. A feature extractor using linear transformation matrix is further employed to extract the classification-oriented features. With a Euclidean distance based classifier, each nonoverlapping window of the fabric image is then assigned to its corresponding category. Minimization of the classification error is achieved by incorporating the design of the feature extractor with the design of the classifier based on minimum classification error (MCE) training method. The proposed method has been evaluated on the classification of 329 defect samples containing nine classes of fabric defects, and 328 nondefect samples, where 93.1% classification accuracy has been achieved.","PeriodicalId":202482,"journal":{"name":"Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the 2002 IEEE Industry Applications Conference. 37th IAS Annual Meeting (Cat. No.02CH37344)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.2002.1044102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
This paper proposes a new method for fabric defect classification by incorporating the design of a wavelet frames based feature extractor with the design of a Euclidean distance based classifier. Channel variances at the outputs of the wavelet frame decomposition are used to characterize each nonoverlapping window of the fabric image. A feature extractor using linear transformation matrix is further employed to extract the classification-oriented features. With a Euclidean distance based classifier, each nonoverlapping window of the fabric image is then assigned to its corresponding category. Minimization of the classification error is achieved by incorporating the design of the feature extractor with the design of the classifier based on minimum classification error (MCE) training method. The proposed method has been evaluated on the classification of 329 defect samples containing nine classes of fabric defects, and 328 nondefect samples, where 93.1% classification accuracy has been achieved.