Automated test program generation for automotive devices

A. Drappa, Peter Huber, Jon Vollmar
{"title":"Automated test program generation for automotive devices","authors":"A. Drappa, Peter Huber, Jon Vollmar","doi":"10.1109/TEST.2010.5699253","DOIUrl":null,"url":null,"abstract":"A code generator is developed to produce automotive ATE programs from a tester-independent test specification. Requirements and features of the specification interface which were necessary for successful automated program generation are discussed. Generated tests are evaluated on tester hardware and found to be production-worthy. Results and advantages of the approach are observed in practice.","PeriodicalId":265156,"journal":{"name":"2010 IEEE International Test Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2010.5699253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

A code generator is developed to produce automotive ATE programs from a tester-independent test specification. Requirements and features of the specification interface which were necessary for successful automated program generation are discussed. Generated tests are evaluated on tester hardware and found to be production-worthy. Results and advantages of the approach are observed in practice.
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自动测试程序生成汽车设备
开发了一个代码生成器,用于根据测试人员独立的测试规范生成汽车自动测试程序。讨论了成功的自动化程序生成所必需的规范接口的需求和特征。生成的测试在测试硬件上进行评估,并发现具有生产价值。实践证明了该方法的有效性和优越性。
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