{"title":"Development of a scan system for Rayleigh, shear and longitudinal wave velocity mapping","authors":"S. Sathish, R. Martin","doi":"10.1109/ULTSYM.1999.849470","DOIUrl":null,"url":null,"abstract":"A high precision scanning acoustic microscope system to generate C-scan type velocity images of Rayleigh, surface skimming longitudinal (SSLW) and surface skimming shear waves (SSSW), has been developed. The acoustic microscope utilizes impulse excitation to separate in the time domain the direct reflected signal from the surface acoustic wave signals. Differences in the arrival times of these signals at two defocuses are used to compute the velocity and display a 2D x/y velocity in real time during the scan. A map of the Young's modulus of the material is generated using the velocity images. Examples of measurement on standard samples and Ti-6Al-4V alloys are presented.","PeriodicalId":339424,"journal":{"name":"1999 IEEE Ultrasonics Symposium. Proceedings. International Symposium (Cat. No.99CH37027)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE Ultrasonics Symposium. Proceedings. International Symposium (Cat. No.99CH37027)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1999.849470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A high precision scanning acoustic microscope system to generate C-scan type velocity images of Rayleigh, surface skimming longitudinal (SSLW) and surface skimming shear waves (SSSW), has been developed. The acoustic microscope utilizes impulse excitation to separate in the time domain the direct reflected signal from the surface acoustic wave signals. Differences in the arrival times of these signals at two defocuses are used to compute the velocity and display a 2D x/y velocity in real time during the scan. A map of the Young's modulus of the material is generated using the velocity images. Examples of measurement on standard samples and Ti-6Al-4V alloys are presented.
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