{"title":"A Generic Formalism to Model ESD Snapback for Robust Circuit Simulation","authors":"Tianshi Wang, C. McAndrew","doi":"10.23919/EOS/ESD.2018.8509752","DOIUrl":null,"url":null,"abstract":"This paper introduces a way of modeling the abrupt turn-on/off behavior of ESD protection devices using entirely continuous and smooth equations. It presents accurate and robust ESD snapback models that are convenient and flexible to use for various types of ESD protection devices without convergence issues during simulation.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509752","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
This paper introduces a way of modeling the abrupt turn-on/off behavior of ESD protection devices using entirely continuous and smooth equations. It presents accurate and robust ESD snapback models that are convenient and flexible to use for various types of ESD protection devices without convergence issues during simulation.
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