About robustness of test patterns regarding multiple faults

Abstract

We present a new idea of test groups as a general approach to generate test patterns for multiple stuck-at-faults in combinational circuits. All faults of any multiplicity are assumed present in the circuit and we do not need to enumerate them. Unlike the known approaches, we do not target faults as test objectives. The goal is to verify the correctness of a part of the circuit The final test is presented as a set of test pattern groups where each group has the goal to identify the correctness of a selected part of a circuit. The method facilitates fault diagnosis in the presence of multiple faults. The knowledge about identified correct parts of the circuit allows to extend step by step the core of the circuit proved as correct.