A 3.5ns, 2W, 20mm216Kb ECL bipolar RAM

K. Yamaguchi, H. Nambu, K. Kanetani, N. Homma, Y. Nishioka, A. Uchida, K. Ogiue
{"title":"A 3.5ns, 2W, 20mm216Kb ECL bipolar RAM","authors":"K. Yamaguchi, H. Nambu, K. Kanetani, N. Homma, Y. Nishioka, A. Uchida, K. Ogiue","doi":"10.1109/ISSCC.1986.1156927","DOIUrl":null,"url":null,"abstract":"THIS PAPER WILL DESCRIBE a 3.5ns ECL 16Kb bipolar RAM with a power dissipation of 2W, cell size of 4 9 5 ~ 2 and chip size of 20mm2. The most critical requirements for bipolar RAMs are high speed, low power dissipation and small chip size. Two circuit techniques are proposed to meet the foregoing criteria: ( I ) a Schottky barrier diode (SBD) decoder combined with an address buffer and a latch circuit having three-level VBB; ( 2 ) a Darlington word driver having double-stage discharge circuits. The SBD decoder circuit combined with the address buffer and latch circuits is shown in Figure 1. The decoder reduces access time by 20% compared to a conventional multi-emitter decoder, because the parasitic capacitance CDE at the decoder output can be reduced by about 65%. The lower capacitance is due to the small area and small junction capacitance per unit area. Two SBDs have been connected in series to obtain a forward voltage higher than a base-emitter voltage VBE of the transistor QE. This enables the decoder to be completely cut off, insuring a sufficiently high level at the decoder output. To realize even higher speeds at the system level, an on-chip buffer and latch must be combined with the SBD decoder. However, a simple combination of the conventional address buffer and latch using a series gate’ and SBD decoder cannot be used because of transistor (Ql /Q2) saturation under a given supply voltage (-5.2V); Figure 1. To overcome this problem, an address buffer and latch with a threelevel VBB, also shown in Figure 1, is proposed. The latch operation can be performed by the three-level VBB without any loss in speed. Until the clock CLK turns on, the VBB generator offers a VBB in accordance with the previous address input (ADR) levels as shown in Figure 2. That is, the VBB is set to a lower (higher) level than any address input level for high (low) level address input. Therefore, the outputs of the address buffer are held high or low regardless of the following address input changes. When the clock CLK turns on at to, the output of the VBB generator is switched to a standard VBB level for a 10K or lOOK logic family. Thus, the outputs of the address buffers can be changed in accordance with the address inputs. This address information is retained when the CLK turns off again. Figure 3 shows a Darlington word driver using double-stage discharge circuits connected to each of the transistor emitters. Sufficient discharge currents are provided (I1 = 2mA, I2 = 6mA) without a significant voltage drop on the word line. Conventional delayed discharge circuits are also used at the end of the word lines to increase the cell margin. Since both discharge circuits are delay-type, it is possible to maintain a high current after the word line voltage switches to a low level. The driver reduces further the access time by about 15Yc. The increase in power dissipation is negligibly small in spite of the high","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1156927","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

THIS PAPER WILL DESCRIBE a 3.5ns ECL 16Kb bipolar RAM with a power dissipation of 2W, cell size of 4 9 5 ~ 2 and chip size of 20mm2. The most critical requirements for bipolar RAMs are high speed, low power dissipation and small chip size. Two circuit techniques are proposed to meet the foregoing criteria: ( I ) a Schottky barrier diode (SBD) decoder combined with an address buffer and a latch circuit having three-level VBB; ( 2 ) a Darlington word driver having double-stage discharge circuits. The SBD decoder circuit combined with the address buffer and latch circuits is shown in Figure 1. The decoder reduces access time by 20% compared to a conventional multi-emitter decoder, because the parasitic capacitance CDE at the decoder output can be reduced by about 65%. The lower capacitance is due to the small area and small junction capacitance per unit area. Two SBDs have been connected in series to obtain a forward voltage higher than a base-emitter voltage VBE of the transistor QE. This enables the decoder to be completely cut off, insuring a sufficiently high level at the decoder output. To realize even higher speeds at the system level, an on-chip buffer and latch must be combined with the SBD decoder. However, a simple combination of the conventional address buffer and latch using a series gate’ and SBD decoder cannot be used because of transistor (Ql /Q2) saturation under a given supply voltage (-5.2V); Figure 1. To overcome this problem, an address buffer and latch with a threelevel VBB, also shown in Figure 1, is proposed. The latch operation can be performed by the three-level VBB without any loss in speed. Until the clock CLK turns on, the VBB generator offers a VBB in accordance with the previous address input (ADR) levels as shown in Figure 2. That is, the VBB is set to a lower (higher) level than any address input level for high (low) level address input. Therefore, the outputs of the address buffer are held high or low regardless of the following address input changes. When the clock CLK turns on at to, the output of the VBB generator is switched to a standard VBB level for a 10K or lOOK logic family. Thus, the outputs of the address buffers can be changed in accordance with the address inputs. This address information is retained when the CLK turns off again. Figure 3 shows a Darlington word driver using double-stage discharge circuits connected to each of the transistor emitters. Sufficient discharge currents are provided (I1 = 2mA, I2 = 6mA) without a significant voltage drop on the word line. Conventional delayed discharge circuits are also used at the end of the word lines to increase the cell margin. Since both discharge circuits are delay-type, it is possible to maintain a high current after the word line voltage switches to a low level. The driver reduces further the access time by about 15Yc. The increase in power dissipation is negligibly small in spite of the high
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
3.5ns, 2W, 20mm216Kb ECL双极RAM
本文将介绍一种3.5ns ECL 16Kb双极RAM,其功耗为2W,单元尺寸为49.5 ~ 2,芯片尺寸为20mm2。双极ram最关键的要求是高速、低功耗和小芯片尺寸。为了满足上述标准,提出了两种电路技术:(1)将肖特基势垒二极管(SBD)解码器与具有三电平VBB的地址缓冲器和锁存电路相结合;(2)具有双级放电电路的达林顿字驱动器。与地址缓冲区和锁存电路相结合的SBD解码器电路如图1所示。与传统的多发射极解码器相比,解码器的访问时间减少了20%,因为解码器输出端的寄生电容CDE可以减少约65%。较低的电容是由于面积小,单位面积结电容小。两个sdd已串联,以获得一个正向电压高于基极-发射极电压VBE的晶体管QE。这使得解码器可以完全切断,确保解码器输出的电平足够高。为了在系统级实现更高的速度,片上缓冲器和锁存器必须与SBD解码器相结合。然而,由于晶体管(Ql /Q2)在给定电源电压(-5.2V)下饱和,不能使用使用串联门和SBD解码器的传统地址缓冲器和锁存的简单组合;图1所示。为了克服这个问题,提出了一种带有三电平VBB的地址缓冲器和锁存器,如图1所示。锁存操作可以由三电平VBB执行,没有任何速度损失。在时钟CLK打开之前,VBB生成器根据之前的地址输入(ADR)级别提供VBB,如图2所示。即对于高电平(低电平)地址输入,VBB被设置为比任何地址输入级别低(高)的电平。因此,不管下面的地址输入发生了什么变化,地址缓冲区的输出都会保持高位或低位。当时钟CLK在打开时,VBB发生器的输出切换到10K或lOOK逻辑系列的标准VBB电平。因此,地址缓冲区的输出可以根据地址输入而改变。当CLK再次关闭时,将保留此地址信息。图3显示了一个使用双级放电电路连接到每个晶体管发射器的达林顿字驱动器。提供足够的放电电流(I1 = 2mA, I2 = 6mA),而在字线上没有明显的电压降。传统的延迟放电电路也用于字线的末尾,以增加电池的余量。由于两种放电电路都是延迟型的,因此在线路电压切换到低电平后可以保持高电流。驱动程序进一步减少了大约15Yc的访问时间。尽管功率耗散的增加很高,但可以忽略不计
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A digital processor for decoding of composite TV signals using adaptive filtering A flat-panel display control IC with 150V drivers A 50Mb/s CMOS LED driver circuit A CMOS electrically reprogrammable ASIC with multi-level random logic capabilities A 15ns CMOS 64K RAM
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1