Software Reliability Growth Modeling Involving Burr Type XII distribution and Fault Removal Efficiency

Suneet Saxena
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Abstract

In software reliability analysis various authors have used Burr type XII distribution to model the failure pattern of the system due to its wide variety of flexible shapes. In particular cases it can be reduced to Exponential, Normal, Weibull, Log-logistic, Gamma distributions etc. In proposed paper software reliability growth model has been developed incorporating fault removal efficiency (FRE) and Burr type XII based testing effort function. FRE represents fraction of detected faults which are removed completely. Parameters of model are predicted by LSE whereas MSE is used to perform comparison analysis. Results validate better fitting of data set.
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涉及毛刺分布和故障去除效率的软件可靠性增长模型
在软件可靠性分析中,由于系统具有多种多样的柔性形状,许多作者使用Burr型XII分布来模拟系统的失效模式。在特殊情况下,它可以简化为指数分布、正态分布、威布尔分布、逻辑分布、伽玛分布等。本文提出了结合故障去除效率(FRE)和基于Burr类型XII的测试工作函数的软件可靠性增长模型。FRE表示检测到的故障中被完全排除的部分。模型参数由LSE预测,MSE进行比较分析。结果验证了数据集的较好拟合。
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