{"title":"Diagnostic modeling of digital systems with low- and high-level decision diagrams","authors":"R. Ubar","doi":"10.1109/LATW.2013.6562656","DOIUrl":null,"url":null,"abstract":"The complexity of digital systems is constantly growing. This has resulted in an increasing trend in design errors and manufacturing faults in modern VLSI systems. As the result, verification and test will continue to dominate as crucial factors in time-to-market, reliability, and cost of VLSI systems.","PeriodicalId":186736,"journal":{"name":"2013 14th Latin American Test Workshop - LATW","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 14th Latin American Test Workshop - LATW","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2013.6562656","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The complexity of digital systems is constantly growing. This has resulted in an increasing trend in design errors and manufacturing faults in modern VLSI systems. As the result, verification and test will continue to dominate as crucial factors in time-to-market, reliability, and cost of VLSI systems.
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