{"title":"Effects of Conducted Interference on a Microcontroller Based on IEC 62132-4 and IEC 62215-3","authors":"Felix Burghardt, H. Garbe","doi":"10.1109/EMCEUROPE48519.2020.9245782","DOIUrl":null,"url":null,"abstract":"Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.","PeriodicalId":332251,"journal":{"name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE48519.2020.9245782","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Due to short traces inside a microcontroller (e.g. die, bond wires), the effects of coupled electromagnetic far fields below 1GHz can be neglected. For this reason, it can be assumed that a microcontroller is only influenced by conducted interference as long as these coupled-in far field interference signals are not higher than 1GHz. IEC62132-4 and IEC62215-3 describe the procedure for such examinations. In this work, the structure of a test board, which is required for the analysis of an 8-pin microcontroller, is described. In addition, a procedure is shown, how the corresponding peripheral circuits are designed and how the immunity of a microcontroller is determined. Finally, the question is clarified whether, based on the behavior of individual pins, conclusions can be drawn about all pins of the microcontroller.
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