Diagonal Hamming Based Multi-Bit Error Detection and Correction Technique for Memories

G. M. Sai, K. Avinash, L. S. G. Naidu, M. Rohith, M. Vinodhini
{"title":"Diagonal Hamming Based Multi-Bit Error Detection and Correction Technique for Memories","authors":"G. M. Sai, K. Avinash, L. S. G. Naidu, M. Rohith, M. Vinodhini","doi":"10.1109/ICCSP48568.2020.9182249","DOIUrl":null,"url":null,"abstract":"Temporary errors which are classified under soft errors are created because of fluctuations in the voltage or external radiations. These errors are very common and obvious in memories. In this paper, Diagonal Hamming based multi-bit error detection and correction technique is proposed to identify errors to an extent of 8-bit. Rectification of 1, 2, 3, 4, 5 bit errors are possible. Few combinations of 6 and 7 random bit errors and burst errors of 8 bit are correctable. By using this method, high code rate is achieved with less area and delay when in contrast to various techniques.","PeriodicalId":321133,"journal":{"name":"2020 International Conference on Communication and Signal Processing (ICCSP)","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Conference on Communication and Signal Processing (ICCSP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCSP48568.2020.9182249","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Temporary errors which are classified under soft errors are created because of fluctuations in the voltage or external radiations. These errors are very common and obvious in memories. In this paper, Diagonal Hamming based multi-bit error detection and correction technique is proposed to identify errors to an extent of 8-bit. Rectification of 1, 2, 3, 4, 5 bit errors are possible. Few combinations of 6 and 7 random bit errors and burst errors of 8 bit are correctable. By using this method, high code rate is achieved with less area and delay when in contrast to various techniques.
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基于对角汉明的存储器多比特错误检测与校正技术
由于电压波动或外部辐射而产生的临时误差被归为软误差。这些错误在记忆中是非常常见和明显的。本文提出了一种基于对角汉明的多比特误码检测与纠错技术,可识别8位以内的错误。纠正1、2、3、4、5位错误是可能的。6位和7位随机错误和8位突发错误的组合很少是可纠正的。与其他技术相比,该方法可以在较小的面积和延迟下获得较高的码率。
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