{"title":"Interpretation of capacitance-voltage characteristics in thin-film solar cells using a detailed numerical model","authors":"J. Gray","doi":"10.1109/PVSC.1996.564275","DOIUrl":null,"url":null,"abstract":"The objective of this paper is to present a numerical simulation tool that can be used as an aid in the interpretation of the C-V characteristics of thin-film solar cells. The example simulations presented here are for a ZnO/CdS/CuInSe/sub 2/ solar cell, but the simulation tool can be used for a variety of solar cells, including CdTe. Model equations for the simulation of the small-signal behavior of semiconductor devices are presented. Sample simulations incorporating these small-signal equations into a detailed numerical model are interpreted.","PeriodicalId":410394,"journal":{"name":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1996.564275","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The objective of this paper is to present a numerical simulation tool that can be used as an aid in the interpretation of the C-V characteristics of thin-film solar cells. The example simulations presented here are for a ZnO/CdS/CuInSe/sub 2/ solar cell, but the simulation tool can be used for a variety of solar cells, including CdTe. Model equations for the simulation of the small-signal behavior of semiconductor devices are presented. Sample simulations incorporating these small-signal equations into a detailed numerical model are interpreted.
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