Power integrity analysis for core timing models

D. Oh, Yujeong Shim
{"title":"Power integrity analysis for core timing models","authors":"D. Oh, Yujeong Shim","doi":"10.1109/ISEMC.2014.6899083","DOIUrl":null,"url":null,"abstract":"An improved framework of power integrity analysis for core logic timing analysis is presented in this paper. Due to ever increasing power consumption of core digital blocks, jitter due to supply noise contributes a significant timing error, and on-chip logic timing analysis requires accurate modeling of supply noise induced jitter. Jitter information provides additional information to define precise power distribution network (PDN) requirements. The formulation to predict the jitter due to core noise is first presented in this paper followed by the modeling flow that can conveniently be incorporated into existing static timing analysis (STA) analysis. The presented method accounts for potential jitter tracking or anti-tracking between data and clock paths and any AC noise behavior. It covers a general topology including unbalanced clock trees, multi-cycle data paths, and multiple-power domains.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2014.6899083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

An improved framework of power integrity analysis for core logic timing analysis is presented in this paper. Due to ever increasing power consumption of core digital blocks, jitter due to supply noise contributes a significant timing error, and on-chip logic timing analysis requires accurate modeling of supply noise induced jitter. Jitter information provides additional information to define precise power distribution network (PDN) requirements. The formulation to predict the jitter due to core noise is first presented in this paper followed by the modeling flow that can conveniently be incorporated into existing static timing analysis (STA) analysis. The presented method accounts for potential jitter tracking or anti-tracking between data and clock paths and any AC noise behavior. It covers a general topology including unbalanced clock trees, multi-cycle data paths, and multiple-power domains.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
电芯定时模型的功率完整性分析
提出了一种改进的电源完整性分析框架,用于电芯逻辑时序分析。由于核心数字模块的功耗不断增加,由电源噪声引起的抖动会导致显著的时序误差,而片上逻辑时序分析需要精确建模电源噪声引起的抖动。抖动信息为精确定义PDN (power distribution network)要求提供了附加信息。本文首先提出了预测核噪声引起的抖动的公式,然后给出了建模流程,该流程可以方便地纳入现有的静态时序分析(STA)分析。该方法考虑了数据和时钟路径之间潜在的抖动跟踪或反跟踪以及任何交流噪声行为。它涵盖了一般的拓扑结构,包括不平衡时钟树、多周期数据路径和多功率域。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Application of emission source microscopy technique to EMI source localization above 5 GHz Modeling of carbon nanotube-metal contact losses in electronic devices Integrated-circuit countermeasures against information leakage through EM radiation Over-the-air performance testing of a real 4G LTE base station in a reverberation chamber A common-mode active filter in a compact package for a switching mode power supply
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1