Optimization of test/diagnosis/rework location(s) and characteristics in electronic systems assembly using real-coded genetic algorithms

Abstract

This paper presents a framework for optimizing the location(s) and characteristics (fault coverage/test cost, rework success rate/rework cost) of Test/Diagnosis/Rework (TDR) operations in the assembly process for electronic systems. A new search algorithm called Waiting Sequence Search (WSS) is applied to traverse a general process flow in order to perform the cumulative calculation of a yielded cost objective function. Real-Coded Genetic Algorithms (RCGAs) are used to perform a multi-variable optimization that minimizes yielded cost. Several simple cases are analyzed for validation and a general complex process flow is used to demonstrate the applicability of the algorithm.