Bug analysis and corresponding error models in real designs

2007 IEEE International High Level Design Validation and Test Workshop Pub Date : 2007-11-07 DOI:10.1109/HLDVT.2007.4392788

Tao Lv, Tong Xu, Yang Zhao, Huawei Li, Xiaowei Li

引用次数: 5

Abstract

This paper presents the item-missing error model. It stems from the analysis of real bugs that are collected in two market-oriented projects: (1) the AMBA interface of a general-purpose microprocessor IP core; (2) a wireless sensor network oriented embedded processor. The bugs are analyzed via code structure comparison, and it is found that item-missing errors merit attention. The test generation method for item-missing error model is proposed. Structural information obtained from this error model is helpful to reach a greater probability of bug detection than that in random-generation verification with only functional constraints. Finally, the proposed test method is applied in verification of our designs, and experimental results demonstrate the effectiveness of this method.

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实际设计中的Bug分析及相应的误差模型

本文提出了缺失项误差模型。它源于对两个市场化项目中收集到的真实bug的分析:(1)通用微处理器IP核的AMBA接口;(2)一种面向无线传感器网络的嵌入式处理器。通过对代码结构的比较分析，发现缺失项错误值得注意。提出了缺失物品误差模型的测试生成方法。与只有功能约束的随机生成验证相比，从该错误模型中获得的结构信息有助于达到更大的错误检测概率。最后，将所提出的测试方法应用于设计的验证，实验结果证明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2007 IEEE International High Level Design Validation and Test Workshop

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