Fast intra bunch train charge feedback for FELs based on photo injector laser pulse modulation

T. Kozak, Bernd Steffen, S. Pfeiffer, S. Schreiber
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Abstract

Bunch charge variations in Free Electron Lasers such as the Free Electron Laser in Hamburg (FLASH) or the European X-Ray Free Electron Laser (E-XFEL) impacts the longitudinal phase space distribution of the electrons resulting in different bunch peak currents, pulse duration and pulse shapes. The electron bunches are generated by short ultraviolet laser pulses impinging onto a photocathode inside a radio frequency (RF) accelerating cavity. At FLASH, bursts of bunches up to 800 pulses with an intra train repetition rate of 1 MHz are used and even higher repetition rates for the E-XFEL (up to 4.5 Mhz) are planned. Charge variations along these bunch-trains can be caused by variations of the laser pulse energies, instabilities of the accelerating fields in the RF cavity and time dependent effects in the photoemission process. To improve the intra bunch-train charge flatness and to compensate train-to-train fluctuations a dedicated digital control system, based on the Micro Telecommunication Computing Architecture (MicroTCA.4) standard, was designed, implemented and successfully tested at the FLASH. The system consists of a bunch charge detection module which analyzes data from toroid system and provides the input signal for the controller which drives a fast UV-Pockels Cell installed in the optical path of the photo-cathode laser. The Pockels cell alters the laser polarization and thus the transmission through a polarizer. The modulation of UV laser pulse energy with an iterative learning feed-forward minimizing the repetitive errors from bunch-train to bunch-train and a fast feedback algorithm implemented in a Field Programmable Gate Array (FPGA) allows for fast tuning of bunch charge inside the bunch-train. In this paper a detailed description of the system and first measurement results are presented.
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基于光注入激光脉冲调制的束内快速束内电荷反馈
在汉堡自由电子激光器(FLASH)或欧洲x射线自由电子激光器(E-XFEL)中,束荷的变化会影响电子的纵向相空间分布,从而产生不同的束峰电流、脉冲持续时间和脉冲形状。电子束是由短紫外激光脉冲撞击射频加速腔内的光电阴极产生的。在FLASH中,使用了高达800个脉冲串的爆发,列车内重复率为1 MHz,并且计划为E-XFEL提供更高的重复率(高达4.5 MHz)。激光脉冲能量的变化、射频腔内加速场的不稳定性以及光发射过程中的时间依赖效应可以引起这些束列的电荷变化。为了改善列车间电荷平整度和补偿列车间波动,设计了一种基于微通信计算体系结构(MicroTCA.4)标准的专用数字控制系统,并在FLASH上成功地进行了测试。该系统由束电荷检测模块组成,该模块对环面系统的数据进行分析,并为控制器提供输入信号,控制器驱动安装在光电阴极激光器光路中的快速UV-Pockels电池。波克尔斯电池改变了激光的偏振,从而改变了通过偏振器的传输。采用迭代学习前馈调制紫外激光脉冲能量,最大限度地减少了束列之间的重复误差,并在现场可编程门阵列(FPGA)中实现了快速反馈算法,从而实现了束列内部束电荷的快速调谐。本文给出了系统的详细描述和初步测试结果。
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