{"title":"Fault grading, a measure of logic simulation integrity","authors":"L. Greggain, B. White","doi":"10.1109/ASIC.1989.123222","DOIUrl":null,"url":null,"abstract":"It is argued that although fault grading is generally used as a measure of the completeness of the test program, it has an even greater potential in measuring the integrity of the functional analysis as performed by the logic simulation. A brief description of stuck-at-1 and stuck-at-0 fault simulation is given. Fault simulation is contrasted with the typical controllability and observability measures, and the benefits of high fault coverage are examined. A number of standard techniques for improving fault coverage are discussed.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
It is argued that although fault grading is generally used as a measure of the completeness of the test program, it has an even greater potential in measuring the integrity of the functional analysis as performed by the logic simulation. A brief description of stuck-at-1 and stuck-at-0 fault simulation is given. Fault simulation is contrasted with the typical controllability and observability measures, and the benefits of high fault coverage are examined. A number of standard techniques for improving fault coverage are discussed.<>
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