M. Dusek, V. Derbek, A. Povalac, J. Sebesta, R. Maršálek
{"title":"Hardware and Software Stack for an SDR-Based RFID Test Platform","authors":"M. Dusek, V. Derbek, A. Povalac, J. Sebesta, R. Maršálek","doi":"10.1109/RFID.2012.15","DOIUrl":null,"url":null,"abstract":"This paper describes a software defined radio system for measurements of minimum activation power and backscatter power of UHF RFID tags. We propose a platform for performance testing of tags, which is based on a general purpose universal software radio peripheral (USRP) and optimized for operation in the frequency band from 700 MHz to 1100 MHz at the output power of 2 W ERP. The presented HW and SW stack extends the standard library of USRP with RFID specific functions, an interface to LabVIEW, and by a top level LabVIEW code for automated testing.","PeriodicalId":196995,"journal":{"name":"2012 Fourth International EURASIP Workshop on RFID Technology","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Fourth International EURASIP Workshop on RFID Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFID.2012.15","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
This paper describes a software defined radio system for measurements of minimum activation power and backscatter power of UHF RFID tags. We propose a platform for performance testing of tags, which is based on a general purpose universal software radio peripheral (USRP) and optimized for operation in the frequency band from 700 MHz to 1100 MHz at the output power of 2 W ERP. The presented HW and SW stack extends the standard library of USRP with RFID specific functions, an interface to LabVIEW, and by a top level LabVIEW code for automated testing.