{"title":"A Testing Device for Thin Film Electroluminescent Indicators","authors":"O. Maksimova, P. Nikolaev","doi":"10.1109/APEDE.2018.8542353","DOIUrl":null,"url":null,"abstract":"Elements of a display are an important part of information systems. Necessary to study parameters of materials and designs. To create new samples of indicators and control the quality. This problem required an integrated approach. Therefore the development of an automated device for testing thin film electroluminescent indicators is an important task as it allows accelerating the search for new materials and structures with necessary parameters. Investigators of Ulyanovsk State Technical University together with scientists from Ulyanovsk State Civil Aviation University investigated the algorithms, methods and devices for measuring parameters of thin film electroluminescent indicators. As a result of the project of the automated device for testing thin film electroluminescent indicators was developed.","PeriodicalId":311577,"journal":{"name":"2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEDE.2018.8542353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Elements of a display are an important part of information systems. Necessary to study parameters of materials and designs. To create new samples of indicators and control the quality. This problem required an integrated approach. Therefore the development of an automated device for testing thin film electroluminescent indicators is an important task as it allows accelerating the search for new materials and structures with necessary parameters. Investigators of Ulyanovsk State Technical University together with scientists from Ulyanovsk State Civil Aviation University investigated the algorithms, methods and devices for measuring parameters of thin film electroluminescent indicators. As a result of the project of the automated device for testing thin film electroluminescent indicators was developed.
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