On the metrology and analysis of MSF error

Olga Kukso, R. Rascher, M. Pohl, R. Boerret
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Abstract

The aim of our research was to study middle spatial frequency errors (MSFE) on optical surfaces. We investigate the surfaces after manufacturing processes to find out the main affecting factors and to choose the proper processing parameters to minimize the size of the errors. To find an appropriate parameter window we have to be able not only to define the factors, which lead to MSFE, but also to analyze the change of the error after next following production steps.
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MSF误差的计量与分析
本研究的目的是研究光学表面的中频误差(MSFE)。对加工后的表面进行了研究,找出了主要的影响因素,并选择了合适的加工参数,使加工误差最小。为了找到一个合适的参数窗口,我们不仅要能够定义导致MSFE的因素,还要能够分析下一个生产步骤后误差的变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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