{"title":"A 2.52 THz electrically controlled object reflectivity measurement plan","authors":"Jian-Yu She, Yun-Da Li, Qi Li, Qi Wang","doi":"10.1109/ICOOM.2012.6316257","DOIUrl":null,"url":null,"abstract":"To measure the weak reflection characteristics of certain objects, a 2.52 THz electrically controlled object reflectivity measurement plan based on a THz laser and a cell detector has been proposed. The measurement theory was introduced. The solutions of the measurement errors caused by manual control, different object thicknesses, placed position and asynchronous signal have been also presented.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Optoelectronics and Microelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICOOM.2012.6316257","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
To measure the weak reflection characteristics of certain objects, a 2.52 THz electrically controlled object reflectivity measurement plan based on a THz laser and a cell detector has been proposed. The measurement theory was introduced. The solutions of the measurement errors caused by manual control, different object thicknesses, placed position and asynchronous signal have been also presented.
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