Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong
{"title":"A W-Band Low Loss, High Power SPDT Switch Using Reverse Saturated $0.13\\ \\mu \\mathrm{m}$ SiGe HBTs","authors":"Peigen Zhou, Haoyi Dong, Zhigang Peng, Jixin Chen, Debin Hou, P. Yan, Yu Xiang, W. Hong","doi":"10.1109/RFIT.2018.8524122","DOIUrl":null,"url":null,"abstract":"This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\\ {\\mu} \\mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.","PeriodicalId":297122,"journal":{"name":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"784 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2018.8524122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents a sigle-pole double-throw (SPDT) switch using a $0.13\ {\mu} \mathbf{m}$ reverse saturated SiGe HBTs. The switch is based on ${\lambda}/4$ transmission line and the performance of insertion loss and isolation is improved by adding a small area of substrate contacts around the NPN transistors and an isolation-boosting inductance between the collector and emitter, respectively. A measured insertion loss of 1.4-1.6 dB is achieved at 81-98 GHz and < 2.5 dB in the whole W-band frequencies. The measured output port-to-port isolation is > 25 dB at 78-97 GHz and > 20dB in W-band frequencies. The return loss is better than 10 dB at 75-102 GHz. To the best of the authors' knowledge, the proposed switch demonstrates the lowest insertion loss in the silicon-based SPDT switches in W-band frequencies.