{"title":"An efficient parallel transparent diagnostic BIST","authors":"D. Huang, W. Jone","doi":"10.1109/ATS.2000.893640","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a new transparent Built-in Self-Diagnosis (BISD) method to diagnose multiple embedded memory arrays with various sizes in parallel. A new transparent diagnostic interface has been proposed to perform testing in normal mode. By tolerating redundant read/write/shift operations, we develop a new march algorithm called TDiagRSMarch to achieve the goals of low hardware overhead, lower test time, and high test coverage. Experimental results demonstrate that the diagnostic efficiency of TDiagRSMarch is independent of memory topology, defect-type distribution, and degree of parallelism.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Ninth Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2000.893640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this paper, we propose a new transparent Built-in Self-Diagnosis (BISD) method to diagnose multiple embedded memory arrays with various sizes in parallel. A new transparent diagnostic interface has been proposed to perform testing in normal mode. By tolerating redundant read/write/shift operations, we develop a new march algorithm called TDiagRSMarch to achieve the goals of low hardware overhead, lower test time, and high test coverage. Experimental results demonstrate that the diagnostic efficiency of TDiagRSMarch is independent of memory topology, defect-type distribution, and degree of parallelism.
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