Persistent homology based goodness-of-fit tests for spatial tessellations

IF 0.8 4区 数学 Q3 STATISTICS & PROBABILITY Journal of Nonparametric Statistics Pub Date : 2023-11-09 DOI:10.1080/10485252.2023.2280022
Christian Hirsch, Johannes Krebs, Claudia Redenbach
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Abstract

AbstractMotivated by the rapidly increasing relevance of virtual material design in the domain of materials science, it has become essential to assess whether topological properties of stochastic models for a spatial tessellation are in accordance with a given dataset. Recently, tools from topological data analysis such as the persistence diagram have allowed to reach profound insights in a variety of application contexts. In this work, we establish the asymptotic normality of a variety of test statistics derived from a tessellation-adapted refinement of the persistence diagram. Since in applications, it is common to work with tessellation data subject to interactions, we establish our main results for Voronoi and Laguerre tessellations whose generators form a Gibbs point process. We elucidate how these conceptual results can be used to derive goodness of fit tests, and then investigate their power in a simulation study. Finally, we apply our testing methodology to a tessellation describing real foam data.Keywords: Tessellationtopological data analysisgoodness-of-fitpersistence diagram2010 Mathematics Subject Classifications: 60K3560F1082C22 AcknowledgmentsWe thank the two anonymous referees for their careful reading of the manuscript. Their comments and suggestions substantially improved the quality of the presentation. We thank Anne Jung (Helmut Schmidt University Hamburg) for providing the foam sample and Christian Jung (RPTU Kaiserslautern-Landau) for computing the Laguerre approximation.Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationFundingJohannes Krebs was partially supported by the German Research Foundation (DFG), Grant Number KR-4977/2-1.
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基于持续同调的空间镶嵌拟合优度检验
摘要由于虚拟材料设计在材料科学领域的相关性迅速增加,评估空间镶嵌随机模型的拓扑特性是否符合给定的数据集变得至关重要。最近,来自拓扑数据分析(如持久性图)的工具已经允许在各种应用程序上下文中获得深刻的见解。在这项工作中,我们建立了各种测试统计量的渐近正态性,这些统计量来自于持久图的自适应细分细化。由于在应用程序中,通常会处理受交互影响的镶嵌数据,因此我们建立了Voronoi和Laguerre镶嵌的主要结果,其生成器形成吉布斯点过程。我们阐明如何使用这些概念结果来推导拟合优度检验,然后在模拟研究中研究它们的能力。最后,我们将我们的测试方法应用于描述真实泡沫数据的镶嵌。关键词:细分拓扑数据分析拟合优度持续图2010数学学科分类:60K3560F1082C22致谢感谢两位匿名审稿人对本文的认真阅读。他们的意见和建议大大提高了报告的质量。我们感谢Anne Jung(汉堡赫尔穆特施密特大学)提供的泡沫样品和Christian Jung (RPTU Kaiserslautern-Landau)计算的Laguerre近似。披露声明作者未报告潜在的利益冲突。johannes Krebs的部分资金由德国研究基金会(DFG)提供,资助号为KR-4977/2-1。
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来源期刊
Journal of Nonparametric Statistics
Journal of Nonparametric Statistics 数学-统计学与概率论
CiteScore
1.50
自引率
8.30%
发文量
42
审稿时长
6-12 weeks
期刊介绍: Journal of Nonparametric Statistics provides a medium for the publication of research and survey work in nonparametric statistics and related areas. The scope includes, but is not limited to the following topics: Nonparametric modeling, Nonparametric function estimation, Rank and other robust and distribution-free procedures, Resampling methods, Lack-of-fit testing, Multivariate analysis, Inference with high-dimensional data, Dimension reduction and variable selection, Methods for errors in variables, missing, censored, and other incomplete data structures, Inference of stochastic processes, Sample surveys, Time series analysis, Longitudinal and functional data analysis, Nonparametric Bayes methods and decision procedures, Semiparametric models and procedures, Statistical methods for imaging and tomography, Statistical inverse problems, Financial statistics and econometrics, Bioinformatics and comparative genomics, Statistical algorithms and machine learning. Both the theory and applications of nonparametric statistics are covered in the journal. Research applying nonparametric methods to medicine, engineering, technology, science and humanities is welcomed, provided the novelty and quality level are of the highest order. Authors are encouraged to submit supplementary technical arguments, computer code, data analysed in the paper or any additional information for online publication along with the published paper.
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