Investigating DC Characteristics in Testing Precision Current Shunts for Steady State

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2023-11-01 DOI:10.1007/s12647-023-00697-z
Valentyn Isaiev, Svitlana Isaieva
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Abstract

This paper provides information on the performance study of precision current shunts in the context of their output voltage stability. Besides, it briefly focuses on the phenomena affecting the steady state of these measuring instruments. The authors present a methodology for testing current shunts to ensure a high-quality result of current measurement. The investigation highlights three characteristics of shunts (the dependence of resistance on temperature, the response of the output voltage to a fast increase of current, and the transition from a cold state to a warm one). The test equipment with precision shunts were considered during the experimental examination. The results of an investigation confirmed satisfactory operational properties and compliance with the needs of laboratories. Additionally, the authors emphasize using a precision shunt as a measuring standard when calibrating other instruments like high-precision digital ammeters. From this point of view, the simplified mathematical modeling of the change in the AC-DC transfer difference, depending on the resistance change caused by the warming current, was carried out.

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在测试稳态精密电流分流器时研究直流特性
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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