Method of earth fault loop impedance measurement without nuisance tripping of RCDs in 3-phase low-voltage circuits

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Metrology and Measurement Systems Pub Date : 2023-11-06 DOI:10.24425/mms.2019.128350
Stanisław Czapp
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引用次数: 6

Abstract

Verification of electrical safety in low-voltage power systems includes the measurement of earth fault loop impedance. This measurement is performed to verify the effectiveness of protection against indirect contact. The widespread classic methods and meters use a relatively high value of the measuring current ( 5 (cid:4) 20 ) A, so that they are a source of nuisance tripping of residual current devices (RCDs). The meters dedicated to circuits with RCDs usually use an extremely low value of current (lower than 15 mA), which in many cases it is not acceptable in terms of the measurement accuracy. This paper presents a method of earth fault loop impedance measurement in 3-phase circuits, without nuisance tripping of RCDs – the concept of measurement, the meter structure and the experimental validation. The nuisance tripping is avoided in spite of the use of measuring current value many times higher than that of the rated residual current of RCDs. The main advantage of the proposed method is the possibility of creating values of measuring current in a very wide range, what is very important with regard to accuracy of the measurement.
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来源期刊
Metrology and Measurement Systems
Metrology and Measurement Systems INSTRUMENTS & INSTRUMENTATION-
CiteScore
2.00
自引率
10.00%
发文量
0
审稿时长
6 months
期刊介绍: Contributions are invited on all aspects of the research, development and applications of the measurement science and technology. The list of topics covered includes: theory and general principles of measurement; measurement of physical, chemical and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; processing and data analysis; measurement systems and embedded systems; design, manufacture and evaluation of instruments. The average publication cycle is 6 months.
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