Insulator Defect Detection Method upon Fused Attention Mechanism and Bidirectional Feature Fusion

IF 4.6 Q1 OPTICS Journal of Physics-Photonics Pub Date : 2023-11-01 DOI:10.1088/1742-6596/2632/1/012013
Yiming Chen
{"title":"Insulator Defect Detection Method upon Fused Attention Mechanism and Bidirectional Feature Fusion","authors":"Yiming Chen","doi":"10.1088/1742-6596/2632/1/012013","DOIUrl":null,"url":null,"abstract":"Abstract Insulators are important components for achieving electrical insulation and mechanical support, but they are prone to various defects in harsh operating environments, which can damage their mechanical strength and insulation performance. This article proposes the Shuffle YOLOv7 model based on the YOLOv7 algorithm for insulator defect detection, aiming to solve the weakness of low precision in traditional object detection algorithms when facing complex backgrounds and small-sized defects. To address the issue of low attention to flashover faults in traditional algorithms, the ShuffleAttention fusion attention mechanism is supplied to concentrate on both intra-channel and inter-channel deep features, and the original PANet structure is replaced with a pyramid which has a bidirectional feature fusion structure to enhance the network’s feature extraction ability. The Focal-EIOU LOSS optimization method focuses on high-quality prior boxes to improve model accuracy, and the effectiveness of the optimization method is verified through ablation experiments. These results of the experiment show that the proposed algorithm achieves varying degrees of performance improvement in terms of precision, recall, average precision, and overall loss compared to mainstream object detection algorithms in detecting insulator damage and flashover.","PeriodicalId":44008,"journal":{"name":"Journal of Physics-Photonics","volume":null,"pages":null},"PeriodicalIF":4.6000,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Physics-Photonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1742-6596/2632/1/012013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0

Abstract

Abstract Insulators are important components for achieving electrical insulation and mechanical support, but they are prone to various defects in harsh operating environments, which can damage their mechanical strength and insulation performance. This article proposes the Shuffle YOLOv7 model based on the YOLOv7 algorithm for insulator defect detection, aiming to solve the weakness of low precision in traditional object detection algorithms when facing complex backgrounds and small-sized defects. To address the issue of low attention to flashover faults in traditional algorithms, the ShuffleAttention fusion attention mechanism is supplied to concentrate on both intra-channel and inter-channel deep features, and the original PANet structure is replaced with a pyramid which has a bidirectional feature fusion structure to enhance the network’s feature extraction ability. The Focal-EIOU LOSS optimization method focuses on high-quality prior boxes to improve model accuracy, and the effectiveness of the optimization method is verified through ablation experiments. These results of the experiment show that the proposed algorithm achieves varying degrees of performance improvement in terms of precision, recall, average precision, and overall loss compared to mainstream object detection algorithms in detecting insulator damage and flashover.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于融合注意机制和双向特征融合的绝缘子缺陷检测方法
绝缘子是实现电气绝缘和机械支撑的重要部件,但在恶劣的工作环境中,绝缘子容易出现各种缺陷,破坏其机械强度和绝缘性能。本文提出了基于YOLOv7算法的Shuffle YOLOv7模型用于绝缘子缺陷检测,旨在解决传统目标检测算法在面对复杂背景和小尺寸缺陷时精度低的缺点。针对传统算法对闪络故障关注不足的问题,提出了ShuffleAttention融合关注机制,同时关注通道内和通道间的深层特征,并将原有的PANet结构替换为具有双向特征融合结构的金字塔结构,增强了网络的特征提取能力。focus - eiou LOSS优化方法着眼于高质量先验盒来提高模型精度,并通过烧蚀实验验证了优化方法的有效性。实验结果表明,与主流目标检测算法相比,本文算法在检测绝缘子损伤和闪络的精度、召回率、平均精度和总损耗等方面均有不同程度的性能提升。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
CiteScore
10.70
自引率
0.00%
发文量
27
审稿时长
12 weeks
期刊最新文献
Wavefront shaping simulations with augmented partial factorization An efficient compact blazed grating antenna for optical phased arrays Highly reflective and high-Q thin resonant subwavelength gratings A practical guide to digital micro-mirror devices (DMDs) for wavefront shaping A modular GUI-based program for genetic algorithm-based feedback-assisted wavefront shaping
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1