Shuang Li, Yang Wang, Hongke Tao, Qing Liu, Zhiwen Zeng, Xiangliang Jin, Hongjiao Yang
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引用次数: 0
Abstract
Abstract Based on the 0.18 μ m CMOS process, proposed a new power-rail electrostatic discharge clamp circuit. The proposed circuit can adjust the voltage biased to the big clamp NMOS (M big ) gate by adjusting the width of one MOS transistor, and the feedback path is designed to prolong the response time of M big . The simulation results demonstrated that the voltage biased to the M big of the proposed circuit has a relatively steady state and the M big has a longer response time, which can effectively reduce the damage to the gate oxide layer of the M big with large voltage overshoot. The transmission line pulse test results show that compared to the M big of the conventional circuit, the M big of the proposed circuit has higher trigger voltage, lower on-resistance, and better robustness.
期刊介绍:
Devoted to semiconductor research, Semiconductor Science and Technology''s multidisciplinary approach reflects the far-reaching nature of this topic.
The scope of the journal covers fundamental and applied experimental and theoretical studies of the properties of non-organic, organic and oxide semiconductors, their interfaces and devices, including:
fundamental properties
materials and nanostructures
devices and applications
fabrication and processing
new analytical techniques
simulation
emerging fields:
materials and devices for quantum technologies
hybrid structures and devices
2D and topological materials
metamaterials
semiconductors for energy
flexible electronics.