Significance of LF & HF Voltage, Current, Phasor Measurement Unit and Microwave Metrology of CSIR-NPL on Scientific and Industrial Growth

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2023-09-23 DOI:10.1007/s12647-023-00685-3
Avni Khatkar, Archana Sahu, Swati Kumari, Sunidhi Luthra, Saood Ahmad
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Abstract

The LF & HF voltage, current and microwave metrology section of the CSIR-National Physical Laboratory plays an imperative role in the metrological investigations in the country as it follows the lawful obligations of the NPL charter of developing and maintaining national standards of HF voltage, LF voltage and current, phasor measurement unit and microwave power parameters. For over three decades, the section has been religiously dedicated to performing national obligations and delivering national calibration, testing and measuring services. Still, there is inadequate awareness, insight and perception related to the role of metrological traceability, calibration and measurement capabilities (CMCs) to the clients, academia, industries and government laboratories. Hence there is a dire need to educate and provide the required information to the end users. Keeping this in mind, this paper provides necessary details of the facilities, technologies and CMCs of the section to the common masses. The International Bureau of Weights and Measures (Bureau International des Poids et Mesures) and Asia Pacific Metrology Programme key/supplementary comparisons are also described in the paper, which has helped the group improve and attain greater heights.

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CSIR-NPL 的低频和高频电压、电流、相位测量装置和微波计量学对科学和工业发展的意义
CSIR 国家物理实验室的低频和amp;高频电压、电流和微波计量部门在国家计量调查中发挥着重要作用,因为它履行国家物理实验室章程规定的合法义务,制定和维护高频电压、低频电压和电流、相位测量单元和微波功率参数的国家标准。三十多年来,该部门一直恪尽职守,履行国家义务,提供国家校准、测试和测量服务。然而,客户、学术界、工业界和政府实验室对计量溯源、校准和测量能力(CMC)的作用仍缺乏足够的认识、了解和理解。因此,亟需对最终用户进行教育并提供所需的信息。考虑到这一点,本文将向普通大众提供有关该部门的设施、技术和 CMC 的必要详细信息。本文还介绍了国际计量局(Bureau International des Poids et Mesures)和亚太计量计划(Asia Pacific Metrology Programme key/supplementary comparisons)的情况,这有助于该小组改进工作并达到更高水平。
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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