Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"HAXPES reference spectra of Pd with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002527","DOIUrl":null,"url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Pd sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Surface Science Spectra","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/6.0002527","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Pd sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
