{"title":"Diffraction by a Parallel-Plate Multiport Using the Method of Kobayashi Potentials","authors":"Babak Honarbakhsh","doi":"10.24200/sci.2023.62039.7613","DOIUrl":null,"url":null,"abstract":"Application of Kobayashi potentials (KP) is extended to the electromagnetic (EM) diffraction from the parallel-plate multiport. Standard integral identities are used for problem formulation, without the direct use of Weber-Schafheitlin (WS) integrals. The Fourier function space is exploited for the construction of the governing linear system of equations. A simple strategy is suggested for the evaluation of the required improper integrals. Two-dimensional T- and X-junctions are studied as special cases. Numerical results are validated through convergence test and asymptotic analysis. It is shown that whenever the wave number in the whole problem domain is positive, no real power transfers to the diffracted field in the horizontal section of the aforementioned structures.","PeriodicalId":21605,"journal":{"name":"Scientia Iranica","volume":"9 1","pages":"0"},"PeriodicalIF":1.4000,"publicationDate":"2023-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scientia Iranica","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.24200/sci.2023.62039.7613","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Application of Kobayashi potentials (KP) is extended to the electromagnetic (EM) diffraction from the parallel-plate multiport. Standard integral identities are used for problem formulation, without the direct use of Weber-Schafheitlin (WS) integrals. The Fourier function space is exploited for the construction of the governing linear system of equations. A simple strategy is suggested for the evaluation of the required improper integrals. Two-dimensional T- and X-junctions are studied as special cases. Numerical results are validated through convergence test and asymptotic analysis. It is shown that whenever the wave number in the whole problem domain is positive, no real power transfers to the diffracted field in the horizontal section of the aforementioned structures.
期刊介绍：
The objectives of Scientia Iranica are two-fold. The first is to provide a forum for the presentation of original works by scientists and engineers from around the world. The second is to open an effective channel to enhance the level of communication between scientists and engineers and the exchange of state-of-the-art research and ideas.
The scope of the journal is broad and multidisciplinary in technical sciences and engineering. It encompasses theoretical and experimental research. Specific areas include but not limited to chemistry, chemical engineering, civil engineering, control and computer engineering, electrical engineering, material, manufacturing and industrial management, mathematics, mechanical engineering, nuclear engineering, petroleum engineering, physics, nanotechnology.
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