Dong Zheng, Christopher N. Young, William F. Stickle
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Abstract
Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Bi sample. Survey data, high-resolution scans of observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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