A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components

Abstract

This letter presents a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip lines as a transmission part. First, the U-shaped loop is designed to test both electric and magnetic fields. Second, two parasitic long loops are placed at both sides of the U-shaped loop to increase the sensitivity. Third, to characterize and calibrate the probe, a standard microstrip line is manufactured and used. Finally, the developed probe is printed and tested to prove the feasibility of the design. The tested results indicate that the probe can not only simultaneously test electric and magnetic fields, but also have a wider working bandwidth and higher sensitivity.