{"title":"A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components","authors":"Lei Wang;Duan Nie;Liye Cheng;Hongyue Wang","doi":"10.1109/LMAG.2023.3324517","DOIUrl":null,"url":null,"abstract":"This letter presents a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip lines as a transmission part. First, the U-shaped loop is designed to test both electric and magnetic fields. Second, two parasitic long loops are placed at both sides of the U-shaped loop to increase the sensitivity. Third, to characterize and calibrate the probe, a standard microstrip line is manufactured and used. Finally, the developed probe is printed and tested to prove the feasibility of the design. The tested results indicate that the probe can not only simultaneously test electric and magnetic fields, but also have a wider working bandwidth and higher sensitivity.","PeriodicalId":13040,"journal":{"name":"IEEE Magnetics Letters","volume":"14 ","pages":"1-5"},"PeriodicalIF":1.1000,"publicationDate":"2023-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Magnetics Letters","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/10284992/","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip lines as a transmission part. First, the U-shaped loop is designed to test both electric and magnetic fields. Second, two parasitic long loops are placed at both sides of the U-shaped loop to increase the sensitivity. Third, to characterize and calibrate the probe, a standard microstrip line is manufactured and used. Finally, the developed probe is printed and tested to prove the feasibility of the design. The tested results indicate that the probe can not only simultaneously test electric and magnetic fields, but also have a wider working bandwidth and higher sensitivity.
这封信介绍了一种能够同时测量电场和磁场分量的高灵敏度复合探针。该复合探头包含一个 U 形环、两个寄生长环和一对作为传输部分的带状线。首先，U 型环设计用于测试电场和磁场。其次，在 U 型环的两侧设置了两个寄生长环，以提高灵敏度。第三，为了鉴定和校准探头，制造并使用了标准微带线。最后，对开发的探头进行打印和测试，以证明设计的可行性。测试结果表明，该探针不仅可以同时测试电场和磁场，而且具有更宽的工作带宽和更高的灵敏度。
期刊介绍：
IEEE Magnetics Letters is a peer-reviewed, archival journal covering the physics and engineering of magnetism, magnetic materials, applied magnetics, design and application of magnetic devices, bio-magnetics, magneto-electronics, and spin electronics. IEEE Magnetics Letters publishes short, scholarly articles of substantial current interest.
IEEE Magnetics Letters is a hybrid Open Access (OA) journal. For a fee, authors have the option making their articles freely available to all, including non-subscribers. OA articles are identified as Open Access.
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