Fault Simulation for Dynamic Failures in Analog and Mixed Signal Circuits

Abstract

Abstract The localization of defects that cause dynamic electrical behavior is a constant challenge for failure analysts. Such types of failures are often present in analog circuits, and standard fault isolation techniques are constrained and not always successful. In this paper, we demonstrate a method to exploit industrial fault simulators in conjunction with standard analysis methods to solve analyses in analog circuits. In addition, we will show methods to adapt fault simulation to these dynamic electrical failure modes. Successful fault isolation results from real-world failure analyses of oscillators, which are typical inside analog and mixed-signal circuits.