Direction-of-arrival method based on randomize-then-optimize approach

Cai-Yi Tang , Sheng Peng , Zhi-Qin Zhao , Bo Jiang
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引用次数: 0

Abstract

The direction-of-arrival (DOA) estimation problem can be solved by the methods based on sparse Bayesian learning (SBL). To assure the accuracy, SBL needs massive amounts of snapshots which may lead to a huge computational workload. In order to reduce the snapshot number and computational complexity, a randomize-then-optimize (RTO) algorithm based DOA estimation method is proposed. The “learning” process for updating hyperparameters in SBL can be avoided by using the optimization and Metropolis-Hastings process in the RTO algorithm. To apply the RTO algorithm for a Laplace prior, a prior transformation technique is induced. To demonstrate the effectiveness of the proposed method, several simulations are proceeded, which verifies that the proposed method has better accuracy with 1 snapshot and shorter processing time than conventional compressive sensing (CS) based DOA methods.

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基于随机优化方法的到达方向法
为了保证准确性,SBL需要大量的快照,这可能导致巨大的计算工作量。为了减少快照个数和计算复杂度,提出了一种基于随机优化(RTO)算法的DOA估计方法。在RTO算法中使用最优化和Metropolis-Hastings过程可以避免SBL中更新超参数的“学习”过程。为了将RTO算法应用于拉普拉斯先验,导出了一种先验变换技术。为了验证该方法的有效性,仿真结果表明,与传统的基于压缩感知(CS)的DOA方法相比,该方法具有单快照精度高、处理时间短的优点。
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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