Big data challenge for monitoring quality in higher education institutions using business intelligence dashboards

Q1 Engineering Journal of Electronic Science and Technology Pub Date : 2024-01-03 DOI:10.1016/j.jnlest.2024.100233

Ali Sorour, Anthony S. Atkins

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Abstract

As big data becomes an apparent challenge to handle when building a business intelligence (BI) system, there is a motivation to handle this challenging issue in higher education institutions (HEIs). Monitoring quality in HEIs encompasses handling huge amounts of data coming from different sources. This paper reviews big data and analyses the cases from the literature regarding quality assurance (QA) in HEIs. It also outlines a framework that can address the big data challenge in HEIs to handle QA monitoring using BI dashboards and a prototype dashboard is presented in this paper. The dashboard was developed using a utilisation tool to monitor QA in HEIs to provide visual representations of big data. The prototype dashboard enables stakeholders to monitor compliance with QA standards while addressing the big data challenge associated with the substantial volume of data managed by HEIs’ QA systems. This paper also outlines how the developed system integrates big data from social media into the monitoring dashboard

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利用商业智能仪表盘监测高等教育机构质量的大数据挑战

随着大数据成为构建商业智能（BI）系统时需要应对的一个明显挑战，高等教育机构（HEIs）也有动力来应对这一具有挑战性的问题。高等教育机构的质量监控包括处理来自不同来源的海量数据。本文回顾了大数据，并分析了有关高等院校质量保证（QA）的文献案例。本文还概述了一个框架，该框架可应对高等院校中的大数据挑战，利用商业智能仪表盘处理质量保证监控，本文还介绍了一个仪表盘原型。该仪表盘是利用高等院校质量保证监控工具开发的，以提供大数据的可视化表示。原型仪表盘使利益相关者能够监测质量保证标准的遵守情况，同时解决与高等院校质量保证系统管理的大量数据相关的大数据挑战。本文还概述了所开发的系统如何将来自社交媒体的大数据整合到监控仪表板中。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering

CiteScore

4.30

自引率

0.00%

发文量

1362

审稿时长

99 days

期刊介绍： JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.