Development of Am-241 Activity Standards

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2023-11-27 DOI:10.1007/s12647-023-00698-y
Ritu Sharma, D. B. Kulkarni, R. Anuradha, V. Sathian, Probal Choudhury
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Abstract

The identification and monitoring of long-lived alpha-emitting radiotoxic radionuclide in nuclear waste management, environmental monitoring and internal dosimetry are crucial as far as the safety of individual, community and environment is concerned. This requires sample preparation techniques with thin, uniform and adherent deposition of actinides on the substrate for carrying accurate and high-resolution alpha-spectrometric measurements. Electrodeposition is one such technique. Standard sources prepared using this method can be used for calibration of detectors for alpha measurements. In this paper, we discuss the methodology adopted for electroplating Am-241 sources and subsequently carrying the standardization of electroplated sources with 2π-Proportional counter (PC). Efficiency of Am-241 electroplated source in 2πPC was determined to be 49%. The sources were further investigated for alpha-spectrometric measurements leading to the generation of high-resolution spectra exhibiting a full-width at half-maximum (FWHM) value of 38 keV. Scanning electron microscopy (SEM) for surface morphological studies yielded non-clustered deposition, indicating the even distribution of radionuclide and consequently, homogeneity. A tissue wipe test was performed to evaluate the adhesion of radionuclide on substrate. The present study reveals the absence of counts on wiped tissue indicating adherency in deposition.

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制定Am-241活动标准
就个人、社区和环境的安全而言,在核废料管理、环境监测和内部剂量测定中识别和监测长寿命α放射毒性放射性核素是至关重要的。这需要样品制备技术,在衬底上薄、均匀和粘附沉积锕系元素,以进行精确和高分辨率的α光谱测量。电沉积就是这样一种技术。用这种方法制备的标准光源可用于α测量的探测器的校准。本文讨论了用2π-比例计数器(PC)对Am-241源进行电镀及对电镀源进行标准化的方法。测定了Am-241电镀源在2πPC中的效率为49%。对这些源进行了进一步的α光谱测量,从而产生了高分辨率光谱,其半最大值全宽度(FWHM)值为38 keV。扫描电子显微镜(SEM)的表面形态学研究产生非簇状沉积,表明放射性核素均匀分布,因此,均匀性。用组织擦拭试验评价放射性核素在基质上的粘附性。目前的研究表明,没有计数擦拭组织表明附着在沉积。
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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