A Sub-6 GHz Switching System for Simultaneous Use of 2-Port Network Analyzer by 4 Users

IF 0.9 4区 工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS International Journal of RF and Microwave Computer-Aided Engineering Pub Date : 2023-12-22 DOI:10.1155/2023/8827119
Youna Jang, Chang In Baek, Dong Min Kim, Dal Ahn, Seong-Ho Son
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Abstract

A vector network analyzer (VNA) is an expensive and essential device for measuring the scattering coefficients of RF devices in the research and development of microwave systems. However, these VNAs are limited in that they can be only used by one user. To address this limitation, this paper presents a switching system that allows multiple users to measure each device under test using a single VNA at the same time. In particular, a four-user switching system is developed in this study. It is important to calibrate the differences between each channel that inevitably arise during implementation. For calibration, we propose and implement a technique for de-embedding the uneven characteristics between these channels. Its performance is validated by measuring insertion loss, reflection loss, and isolation for the developed switching system.
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供 4 名用户同时使用 2 端口网络分析仪的 6 千兆赫以下交换系统
矢量网络分析仪(VNA)是微波系统研发中测量射频器件散射系数的重要设备,价格昂贵。然而,这些 VNA 的局限性在于只能供一个用户使用。为了解决这一局限性,本文提出了一种切换系统,允许多个用户同时使用单个 VNA 测量每个被测设备。本研究特别开发了一个四用户切换系统。校准在实施过程中不可避免地出现的各通道之间的差异非常重要。为进行校准,我们提出并实施了一种技术,用于消除这些通道之间的不均衡特性。通过测量所开发交换系统的插入损耗、反射损耗和隔离度,验证了该技术的性能。
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来源期刊
CiteScore
4.00
自引率
23.50%
发文量
489
审稿时长
3 months
期刊介绍: International Journal of RF and Microwave Computer-Aided Engineering provides a common forum for the dissemination of research and development results in the areas of computer-aided design and engineering of RF, microwave, and millimeter-wave components, circuits, subsystems, and antennas. The journal is intended to be a single source of valuable information for all engineers and technicians, RF/microwave/mm-wave CAD tool vendors, researchers in industry, government and academia, professors and students, and systems engineers involved in RF/microwave/mm-wave technology. Multidisciplinary in scope, the journal publishes peer-reviewed articles and short papers on topics that include, but are not limited to. . . -Computer-Aided Modeling -Computer-Aided Analysis -Computer-Aided Optimization -Software and Manufacturing Techniques -Computer-Aided Measurements -Measurements Interfaced with CAD Systems In addition, the scope of the journal includes features such as software reviews, RF/microwave/mm-wave CAD related news, including brief reviews of CAD papers published elsewhere and a "Letters to the Editor" section.
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