Atsushi Machida, Takeshi Watanabe, M. Mizumaki, K. Nagata, M. Okada
{"title":"Development of a Bayesian inference method for the analysis of X-ray reflectivity data","authors":"Atsushi Machida, Takeshi Watanabe, M. Mizumaki, K. Nagata, M. Okada","doi":"10.35848/1347-4065/ad17de","DOIUrl":null,"url":null,"abstract":"\n X-ray reflectivity is an experimental method used in various fields of materials science to investigate the physical properties of solid surfaces and the structure of interfaces. However, it is difficult to evaluate the reliability of the estimates obtained with this method. In this study, we propose a method for analyzing X-ray reflectivity data using Bayesian inference. Bayesian inference allows the uncertainty of the estimate to be evaluated, which also allows the measurement limit to be evaluated, and also shows that estimation is possible even in noisy situations.","PeriodicalId":14741,"journal":{"name":"Japanese Journal of Applied Physics","volume":"55 15","pages":""},"PeriodicalIF":1.5000,"publicationDate":"2023-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Japanese Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.35848/1347-4065/ad17de","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
X-ray reflectivity is an experimental method used in various fields of materials science to investigate the physical properties of solid surfaces and the structure of interfaces. However, it is difficult to evaluate the reliability of the estimates obtained with this method. In this study, we propose a method for analyzing X-ray reflectivity data using Bayesian inference. Bayesian inference allows the uncertainty of the estimate to be evaluated, which also allows the measurement limit to be evaluated, and also shows that estimation is possible even in noisy situations.
X 射线反射率是材料科学各领域用于研究固体表面物理性质和界面结构的一种实验方法。然而，评估用这种方法获得的估计值的可靠性却非常困难。在本研究中，我们提出了一种使用贝叶斯推断法分析 X 射线反射率数据的方法。贝叶斯推断法可以评估估计值的不确定性，也可以评估测量极限，同时还表明即使在有噪声的情况下也可以进行估计。
期刊介绍：
The Japanese Journal of Applied Physics (JJAP) is an international journal for the advancement and dissemination of knowledge in all fields of applied physics. JJAP is a sister journal of the Applied Physics Express (APEX) and is published by IOP Publishing Ltd on behalf of the Japan Society of Applied Physics (JSAP).
JJAP publishes articles that significantly contribute to the advancements in the applications of physical principles as well as in the understanding of physics in view of particular applications in mind. Subjects covered by JJAP include the following fields:
• Semiconductors, dielectrics, and organic materials
• Photonics, quantum electronics, optics, and spectroscopy
• Spintronics, superconductivity, and strongly correlated materials
• Device physics including quantum information processing
• Physics-based circuits and systems
• Nanoscale science and technology
• Crystal growth, surfaces, interfaces, thin films, and bulk materials
• Plasmas, applied atomic and molecular physics, and applied nuclear physics
• Device processing, fabrication and measurement technologies, and instrumentation
• Cross-disciplinary areas such as bioelectronics/photonics, biosensing, environmental/energy technologies, and MEMS
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