Chenchen Ma, Ting Su, Jiongtao Zhu, Xin Zhang, Hairong Zheng, Dong Liang, Na Wang, Yunxin Zhang, Yongshuai Ge
{"title":"Performance evaluation of quantitative material decomposition in slow kVp switching dual-energy CT","authors":"Chenchen Ma, Ting Su, Jiongtao Zhu, Xin Zhang, Hairong Zheng, Dong Liang, Na Wang, Yunxin Zhang, Yongshuai Ge","doi":"10.3233/xst-230201","DOIUrl":null,"url":null,"abstract":"BACKGROUND:Slow kVp switching technique is an important approach to realize dual-energy CT (DECT) imaging, but its performance has not been thoroughly investigated yet. OBJECTIVE:This study aims at comparing and evaluating the DECT imaging performance of different slow kVp switching protocols, andthus helps determining the optimal system settings. METHODS:To investigate the impact of energy separation, two different beam filtration schemes are compared: the stationary beam filtration and dynamic beam filtration. Moreover, uniform tube voltage modulation and weighted tube voltage modulation are compared along with various modulation frequencies. A model-based direct decomposition algorithm is employed to generate the water and iodine material bases. Both numerical and physical experiments are conducted to verify the slow kVp switching DECT imaging performance. RESULTS: Numerical and experimental results demonstrate that the material decomposition is less sensitive to beam filtration, voltage modulation type and modulation frequency. As a result, robust material-specific quantitative decomposition can be achieved in slow kVp switching DECT imaging. CONCLUSIONS:Quantitative DECT imaging can be implemented with slow kVp switching under a variety of system settings.","PeriodicalId":49948,"journal":{"name":"Journal of X-Ray Science and Technology","volume":"175 1","pages":""},"PeriodicalIF":1.7000,"publicationDate":"2023-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of X-Ray Science and Technology","FirstCategoryId":"3","ListUrlMain":"https://doi.org/10.3233/xst-230201","RegionNum":3,"RegionCategory":"医学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
BACKGROUND:Slow kVp switching technique is an important approach to realize dual-energy CT (DECT) imaging, but its performance has not been thoroughly investigated yet. OBJECTIVE:This study aims at comparing and evaluating the DECT imaging performance of different slow kVp switching protocols, andthus helps determining the optimal system settings. METHODS:To investigate the impact of energy separation, two different beam filtration schemes are compared: the stationary beam filtration and dynamic beam filtration. Moreover, uniform tube voltage modulation and weighted tube voltage modulation are compared along with various modulation frequencies. A model-based direct decomposition algorithm is employed to generate the water and iodine material bases. Both numerical and physical experiments are conducted to verify the slow kVp switching DECT imaging performance. RESULTS: Numerical and experimental results demonstrate that the material decomposition is less sensitive to beam filtration, voltage modulation type and modulation frequency. As a result, robust material-specific quantitative decomposition can be achieved in slow kVp switching DECT imaging. CONCLUSIONS:Quantitative DECT imaging can be implemented with slow kVp switching under a variety of system settings.
期刊介绍:
Research areas within the scope of the journal include:
Interaction of x-rays with matter: x-ray phenomena, biological effects of radiation, radiation safety and optical constants
X-ray sources: x-rays from synchrotrons, x-ray lasers, plasmas, and other sources, conventional or unconventional
Optical elements: grazing incidence optics, multilayer mirrors, zone plates, gratings, other diffraction optics
Optical instruments: interferometers, spectrometers, microscopes, telescopes, microprobes