{"title":"<i>un</i>Drift: A versatile software for fast offline SPM image drift correction.","authors":"Tobias Dickbreder, Franziska Sabath, Lukas Höltkemeier, Ralf Bechstein, Angelika Kühnle","doi":"10.3762/bjnano.14.101","DOIUrl":null,"url":null,"abstract":"<p><p>Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image series. Here, we present <i>un</i>Drift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. <i>un</i>Drift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any additional reference. The first semi-automatic drift correction algorithm analyzes the different distortion of periodic structures in two consecutive up and down (down and up) images, which enables <i>un</i>Drift to correct SPM images without stationary features or overlapping scan areas. The other two algorithms determine the drift velocity from the apparent movement of stationary features either by automatic evaluation of the cross-correlation image or based on positions identified manually by the user. We demonstrate the performance and reliability of <i>un</i>Drift using three challenging examples, namely images distorted by a very high drift velocity, only partly usable images, and images exhibiting an overall weak contrast. Moreover, we show that the semi-automatic analysis of periodic images can be applied to a long series containing hundreds of images measured at the calcite-water interface.</p>","PeriodicalId":8802,"journal":{"name":"Beilstein Journal of Nanotechnology","volume":"14 ","pages":"1225-1237"},"PeriodicalIF":2.6000,"publicationDate":"2023-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10760460/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Beilstein Journal of Nanotechnology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.3762/bjnano.14.101","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2023/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
Scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image series. Here, we present unDrift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. unDrift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any additional reference. The first semi-automatic drift correction algorithm analyzes the different distortion of periodic structures in two consecutive up and down (down and up) images, which enables unDrift to correct SPM images without stationary features or overlapping scan areas. The other two algorithms determine the drift velocity from the apparent movement of stationary features either by automatic evaluation of the cross-correlation image or based on positions identified manually by the user. We demonstrate the performance and reliability of unDrift using three challenging examples, namely images distorted by a very high drift velocity, only partly usable images, and images exhibiting an overall weak contrast. Moreover, we show that the semi-automatic analysis of periodic images can be applied to a long series containing hundreds of images measured at the calcite-water interface.
期刊介绍:
The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology.
The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.