Algorithms for automatic measurement of SIS-type hysteretic underdamped Josephson junction's parameters by current-voltage characteristics

Aleksey G. Vostretsov , Svetlana G. Filatova
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引用次数: 0

Abstract

Some electrical parameters of the SIS-type hysteretic underdamped Josephson junction (JJ) can be measured by its current-voltage characteristics (IVCs). Currents and voltages at JJ are commensurate with the intrinsic noise level of measuring instruments. This leads to the need for multiple measurements with subsequent statistical processing. In this paper, the digital algorithms are proposed for the automatic measurement of the JJ parameters by IVC. These algorithms make it possible to implement multiple measurements and check these JJ parameters in an automatic mode with the required accuracy. The complete sufficient statistics are used to minimize the root-mean-square error of parameter measurement. A sequence of current pulses with slow rising and falling edges is used to drive JJ, and synchronous current and voltage readings at JJ are used to realize measurement algorithms. The algorithm performance is estimated through computer simulations. The significant advantage of the proposed algorithms is the independence from current source noise and intrinsic noise of current and voltage meters, as well as the simple implementation in automatic digital measuring systems. The proposed algorithms can be used to control JJ parameters during mass production of superconducting integrated circuits, which will improve the production efficiency and product quality.

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利用电流-电压特性自动测量 SIS 型滞后欠阻尼约瑟夫森结参数的算法
SIS 型滞后欠阻尼约瑟夫森结(JJ)的一些电气参数可通过其电流-电压特性(IVC)来测量。JJ 的电流和电压与测量仪器的固有噪声水平相称。这就需要进行多次测量,并进行后续统计处理。本文提出了通过 IVC 自动测量 JJ 参数的数字算法。这些算法可以实现多次测量,并在自动模式下以所需的精度检查这些 JJ 参数。完整的充分统计用于最小化参数测量的均方根误差。使用具有缓慢上升沿和下降沿的电流脉冲序列来驱动 JJ,并使用 JJ 上的同步电流和电压读数来实现测量算法。通过计算机模拟对算法性能进行了估计。所提算法的显著优点是不受电流源噪声和电流、电压表固有噪声的影响,而且在自动数字测量系统中实施简单。所提出的算法可用于控制超导集成电路大规模生产过程中的 JJ 参数,从而提高生产效率和产品质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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