Formal description model and conditions for detecting linked coupling faults of the memory devices

IF 3.4 Q2 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS Informatics Pub Date : 2023-12-29 DOI:10.37661/1816-0301-2023-20-4-7-23
V. N. Yarmolik, D. V. Demenkovets, V. V. Petrovskaya, A. A. Ivaniuk
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Abstract

Objectives. The aim of the work is to develop and analyze a formal model for describing complex linked coupling faults of memory devices and to formulate the necessary and sufficient conditions for their detection. The relevance of these studies lies in the fact that modern memory devices, characterized by a large amount of stored data and manufactured according to the latest technological standards, are distinguished by the manifestation of complex types of faults in them.Methods. The presented results are based on the classical theory and practice of march tests (March tests) of memory devices. In particular, the paper uses formal mathematical models for describing memory faults and shows their limitations for representing complex linked coupling faults. The main idea of the approach proposed by the authors is based on the use of a new formal description of such faults, the key element of which is the introduction of roles performed by the cells involved in the fault.Results. Three main roles are defined that cells of the complex linked coupling faults perform, namely the role of the aggressor (A), the role of the victim (V), as well as the role of both the victim and the aggressor (B), performed by two cells simultaneously in relation to each other. It is shown that the scenario for the implementation of the roles of memory failure cells is determined by the marching test used, and, first of all, by the address sequence used to access the cells. The procedure for setting a formal model of a linked fault is given, the basis of which is the roles performed by the cells included in the fault and the scenario specified by the test. A statement is given that determines, on the basis of a new formal description of linked coupling faults, the necessary and sufficient conditions for the detection of such faults. The presence of undetectable linked coupling faults is shown, and the conditions for their detection are formulated using multiple March tests. The conducted experimental studies have confirmed the validity of the formulated provisions of the article. On the basis of the classical example of a linked coupling fault, the fulfillment of necessary and sufficient conditions for its detection by a single march test is shown.Conclusion. The results of the research confirm that the proposed formal mathematical model for describing linked coupling faults makes it possible to determine their detection by marching tests. Within the framework of the proposed model, the necessary and sufficient conditions for detecting linked coupling faults by marching tests that detect single coupled faults are determined.
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用于检测存储器件链接耦合故障的形式化描述模型和条件
工作目标这项工作的目的是开发和分析用于描述存储器设备复杂联动耦合故障的正式模型,并制定检测这些故障的必要和充分条件。这些研究的意义在于,现代存储设备的特点是存储了大量数据,并且是按照最新技术标准制造的,它们的显著特点是出现复杂类型的故障。本文所介绍的结果是基于内存设备行进测试(March 测试)的经典理论和实践。特别是,本文使用了描述存储器故障的正规数学模型,并说明了这些模型在表示复杂的链接耦合故障时的局限性。作者提出的方法的主要思想是基于对此类故障使用新的形式描述,其关键要素是引入故障所涉及的单元所扮演的角色。复杂联动耦合故障的单元所扮演的角色主要有三种,即攻击者角色(A)、受害者角色(V)以及受害者和攻击者角色(B),这两种角色由两个单元同时扮演。结果表明,内存失效单元角色的实现方案取决于所使用的行进测试,首先取决于访问单元所使用的地址序列。本文给出了建立链接故障正式模型的程序,其基础是故障中单元所扮演的角色和测试所指定的场景。在对联动耦合故障进行新的形式描述的基础上,给出了确定检测此类故障的必要条件和充分条件的说明。说明了不可检测的联动耦合故障的存在,并利用多重三月测试制定了检测这些故障的条件。所进行的实验研究证实了文章所制定条款的有效性。以联动耦合故障的经典实例为基础,说明了通过单次三月试验检测联动耦合故障的必要条件和充分条件。研究结果证实,所提出的用于描述联动耦合故障的正规数学模型可以通过行进试验确定其检测。在所提模型的框架内,确定了通过行进测试检测单个耦合故障来检测联动耦合故障的必要条件和充分条件。
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来源期刊
Informatics
Informatics Social Sciences-Communication
CiteScore
6.60
自引率
6.50%
发文量
88
审稿时长
6 weeks
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